| Home > Articles > Published articles > Reduction of the thermal conductivity in free-standing silicon nano-membranes investigated by non-invasive Raman thermometry |
| Date: | 2014 |
| Abstract: | We report on the reduction of the thermal conductivity in ultra-thin suspended Si membranes with high crystalline quality. A series of membranes with thicknesses ranging from 9 nm to 1. 5 μm was investigated using Raman thermometry, a novel contactless technique for thermal conductivity determination. A systematic decrease in the thermal conductivity was observed as reducing the thickness, which is explained using the Fuchs-Sondheimer model through the influence of phonon boundary scattering at the surfaces. The thermal conductivity of the thinnest membrane with d = 9 nm resulted in (9 ± 2) W/mK, thus approaching the amorphous limit but still maintaining a high crystalline quality. |
| Grants: | European Commission 309150 Ministerio de Ciencia e Innovación CSD2010-0044 Ministerio de Ciencia e Innovación MAT2012-31392 |
| Rights: | Aquest document està subjecte a una llicència d'ús Creative Commons. Es permet la reproducció total o parcial, la distribució, la comunicació pública de l'obra i la creació d'obres derivades, fins i tot amb finalitats comercials, sempre i quan es reconegui l'autoria de l'obra original. |
| Language: | Anglès |
| Document: | Article ; recerca ; Versió publicada |
| Published in: | APL materials, Vol. 2, Issue 1 (January 2014) , art. 12113, ISSN 2166-532X |
7 p, 884.6 KB |