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Defects in nano-imprint lithography line patterns : computational modelling and measurement accuracy - Constantoudis, Vassilios (Institute of Nanoscience and Nanotechnology (Grècia)) ; Whitworth, Guy L. (Institut Català de Nanociència i Nanotecnologia) ; Kehagias, Nikolaos (Institut Català de Nanociència i Nanotecnologia) ; Papavieros, George (Aristotle University of Thessaloniki. Physics Department) ; Sotomayor Torres, Clivia M. (Institut Català de Nanociència i Nanotecnologia) ; Gogolides, Evangelos (Institute of Nanoscience and Nanotechnology (Grècia))
 
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