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Bias dependent variability of low-frequency noise in single-layer graphene FETs
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Bias dependent variability of low-frequency noise in single-layer graphene FETs
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Mavredakis, Nikolaos
(Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
;
Garcia Cortadella, Ramon
(Institut Català de Nanociència i Nanotecnologia) ;
Illa, Xavi
(Institut de Microelectrònica de Barcelona) ;
Schaefer, Nathan
(Institut Català de Nanociència i Nanotecnologia) ;
Bonaccini Calia, Andrea
(Institut Català de Nanociència i Nanotecnologia) ;
Guimerà Brunet, Anton
(Institut de Microelectrònica de Barcelona) ;
Garrido, Jose
(Institut Català de Nanociència i Nanotecnologia) ;
Jiménez Jiménez, David
(Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
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