Quantifying thermal transport in buried semiconductor nanostructures : Via cross-sectional scanning thermal microscopy
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Spièce, Jean (Lancaster University. Physics Department)
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Evangeli, Charalambos (Lancaster University. Physics Department) ;
Robson, Alexander J. (Lancaster University. Physics Department) ;
Sachat, Alexandros el (Institut Català de Nanociència i Nanotecnologia) ;
Haenel, Linda (University of Stuttgart) ;
Alonso, M. Isabel (Institut de Ciència de Materials de Barcelona) ;
Garriga, Miquel (Institut de Ciència de Materials de Barcelona) ;
Robinson, Benjamin James (Lancaster University. Material Science Institute) ;
Oehme, Michael (University of Stuttgart) ;
Schulze, Jörg (University of Stuttgart) ;
Alzina, Francesc (Institut Català de Nanociència i Nanotecnologia) ;
Sotomayor Torres, Clivia (Institució Catalana de Recerca i Estudis Avançats) ;
Kolosov, Oleg Victor (Lancaster University. Material Science Institute)
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