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Resonant MEMS pressure sensor in 180 nm CMOS technology obtained by BEOL isotropic etching
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Resonant MEMS pressure sensor in 180 nm CMOS technology obtained by BEOL isotropic etching
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Mata-Hernandez, Diana
(Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica)
;
Fernández Martínez, Daniel
(Institut de Física d'Altes Energies) ;
Banerji, Saoni
(University of Tartu. Institute of Technology. Intelligent Materials and Systems Laboratory) ;
Madrenas, Jordi
(Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica)
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