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Depósito Digital de Documentos de la UAB Encontrados 2 registros  La búsqueda tardó 0.01 segundos. 
1.
14 p, 1012.8 KB Quantification of nanomechanical properties of surfaces by higher harmonic monitoring in amplitude modulated AFM imaging / Gramazio, Federico (Institut Català de Nanociència i Nanotecnologia) ; Lorenzoni, Matteo (Institut de Microelectrònica de Barcelona) ; Pérez Murano, Francesc (Institut de Microelectrònica de Barcelona) ; Evangelio Araujo, Laura (Institut Català de Nanociència i Nanotecnologia) ; Fraxedas, Jordi (Institut Català de Nanociència i Nanotecnologia)
The determination of nanomechanical properties is an intensive topic of study in several fields of nanophysics, from surface and materials science to biology. At the same time, amplitude modulation force microscopy is one of the most established techniques for nanoscale characterization. [...]
2018 - 10.1016/j.ultramic.2018.01.013
Ultramicroscopy, Vol. 187 (April 2018) , p. 20-25  
Registro completo - Creative Commons
2.
17 p, 20.5 MB The new FAST module : a portable and transparent add-on module for time-resolved investigations with commercial scanning probe microscopes / Dri, Carlo (CNR-IOM Laboratorio TASC) ; Panighel, Mirco (CNR-IOM Laboratorio TASC) ; Tiemann, Daniel (Institut Català de Nanociència i Nanotecnologia) ; Patera, Laerte L. (University of Trieste. Department of Physics) ; Troiano, Giulia (Technical University of Munich. Department of Chemistry) ; Fukamori, Yves (Technical University of Munich. Department of Chemistry) ; Knoller, Fabian (Technical University of Munich. Department of Chemistry) ; Lechner, Barbara A. J. (Technical University of Munich. Department of Chemistry) ; Cautero, Giuseppe (Elettra Sincrotrone Trieste) ; Giuressi, Dario (Elettra Sincrotrone Trieste) ; Comelli, Giovanni (University of Trieste. Department of Physics) ; Fraxedas, Jordi (Institut Català de Nanociència i Nanotecnologia) ; Africh, Cristina (CNR-IOM Laboratorio TASC) ; Esch, Friedrich (Technical University of Munich. Department of Chemistry)
Time resolution is one of the most severe limitations of scanning probe microscopies (SPMs), since the typical image acquisition times are in the order of several seconds or even few minutes. As a consequence, the characterization of dynamical processes occurring at surfaces (e. [...]
2019 - 10.1016/j.ultramic.2019.05.010
Ultramicroscopy, Vol. 205 (Oct. 2019) , p. 49-56  
Registro completo - Creative Commons

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