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The new FAST module : a portable and transparent add-on module for time-resolved investigations with commercial scanning probe microscopes
Dri, Carlo (CNR-IOM Laboratorio TASC)
Panighel, Mirco (CNR-IOM Laboratorio TASC)
Tiemann, Daniel (Institut Català de Nanociència i Nanotecnologia)
Patera, Laerte L. (University of Trieste. Department of Physics)
Troiano, Giulia (Technical University of Munich. Department of Chemistry)
Fukamori, Yves (Technical University of Munich. Department of Chemistry)
Knoller, Fabian (Technical University of Munich. Department of Chemistry)
Lechner, Barbara A. J. (Technical University of Munich. Department of Chemistry)
Cautero, Giuseppe (Elettra Sincrotrone Trieste)
Giuressi, Dario (Elettra Sincrotrone Trieste)
Comelli, Giovanni (University of Trieste. Department of Physics)
Fraxedas, Jordi (Institut Català de Nanociència i Nanotecnologia)
Africh, Cristina (CNR-IOM Laboratorio TASC)
Esch, Friedrich (Technical University of Munich. Department of Chemistry)

Fecha: 2019
Resumen: Time resolution is one of the most severe limitations of scanning probe microscopies (SPMs), since the typical image acquisition times are in the order of several seconds or even few minutes. As a consequence, the characterization of dynamical processes occurring at surfaces (e. g. surface diffusion, film growth, self-assembly and chemical reactions) cannot be thoroughly addressed by conventional SPMs. To overcome this limitation, several years ago we developed a first prototype of the FAST module, an add-on instrument capable of driving a commercial scanning tunneling microscope (STM) at and beyond video rate frequencies. Here we report on a fully redesigned version of the FAST module, featuring improved performance and user experience, which can be used both with STMs and atomic force microscopes (AFMs), and offers additional capabilities such as an atom tracking mode. All the new features of the FAST module, including portability between different commercial instruments, are described in detail and practically demonstrated.
Ayudas: European Commission 654360
European Commission 703972
Ministerio de Economía y Competitividad SEV-2017-0706
Nota: Altres ajuts: the ICN2 is funded by the CERCA program/ Generalitat de Catalunya.
Derechos: Aquest document està subjecte a una llicència d'ús Creative Commons. Es permet la reproducció total o parcial, la distribució, i la comunicació pública de l'obra, sempre que no sigui amb finalitats comercials, i sempre que es reconegui l'autoria de l'obra original. No es permet la creació d'obres derivades. Creative Commons
Lengua: Anglès
Documento: Article ; recerca ; Versió acceptada per publicar
Publicado en: Ultramicroscopy, Vol. 205 (Oct. 2019) , p. 49-56, ISSN 1879-2723

DOI: 10.1016/j.ultramic.2019.05.010


Postprint
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El registro aparece en las colecciones:
Documentos de investigación > Documentos de los grupos de investigación de la UAB > Centros y grupos de investigación (producción científica) > Ciencias > Institut Català de Nanociència i Nanotecnologia (ICN2)
Artículos > Artículos de investigación
Artículos > Artículos publicados

 Registro creado el 2021-03-17, última modificación el 2024-09-10



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