The new FAST module : a portable and transparent add-on module for time-resolved investigations with commercial scanning probe microscopes
Dri, Carlo (CNR-IOM Laboratorio TASC)
Panighel, Mirco (CNR-IOM Laboratorio TASC)
Tiemann, Daniel (Institut Català de Nanociència i Nanotecnologia)
Patera, Laerte L. (University of Trieste. Department of Physics)
Troiano, Giulia (Technical University of Munich. Department of Chemistry)
Fukamori, Yves (Technical University of Munich. Department of Chemistry)
Knoller, Fabian (Technical University of Munich. Department of Chemistry)
Lechner, Barbara A. J. (Technical University of Munich. Department of Chemistry)
Cautero, Giuseppe (Elettra Sincrotrone Trieste)
Giuressi, Dario (Elettra Sincrotrone Trieste)
Comelli, Giovanni (University of Trieste. Department of Physics)
Fraxedas, Jordi (Institut Català de Nanociència i Nanotecnologia)
Africh, Cristina (CNR-IOM Laboratorio TASC)
Esch, Friedrich (Technical University of Munich. Department of Chemistry)

Data:	2019
Resum:	Time resolution is one of the most severe limitations of scanning probe microscopies (SPMs), since the typical image acquisition times are in the order of several seconds or even few minutes. As a consequence, the characterization of dynamical processes occurring at surfaces (e. g. surface diffusion, film growth, self-assembly and chemical reactions) cannot be thoroughly addressed by conventional SPMs. To overcome this limitation, several years ago we developed a first prototype of the FAST module, an add-on instrument capable of driving a commercial scanning tunneling microscope (STM) at and beyond video rate frequencies. Here we report on a fully redesigned version of the FAST module, featuring improved performance and user experience, which can be used both with STMs and atomic force microscopes (AFMs), and offers additional capabilities such as an atom tracking mode. All the new features of the FAST module, including portability between different commercial instruments, are described in detail and practically demonstrated.
Ajuts:	European Commission 654360 European Commission 703972 Ministerio de Economía y Competitividad SEV-2017-0706
Nota:	Altres ajuts: the ICN2 is funded by the CERCA program/ Generalitat de Catalunya.
Drets:	Aquest document està subjecte a una llicència d'ús Creative Commons. Es permet la reproducció total o parcial, la distribució, i la comunicació pública de l'obra, sempre que no sigui amb finalitats comercials, i sempre que es reconegui l'autoria de l'obra original. No es permet la creació d'obres derivades.
Llengua:	Anglès
Document:	Article ; recerca ; Versió acceptada per publicar
Publicat a:	Ultramicroscopy, Vol. 205 (Oct. 2019) , p. 49-56, ISSN 1879-2723

DOI: 10.1016/j.ultramic.2019.05.010

Postprint 17 p, 20.5 MB

El registre apareix a les col·leccions:
Documents de recerca > Documents dels grups de recerca de la UAB > Centres i grups de recerca (producció científica) > Ciències > Institut Català de Nanociència i Nanotecnologia (ICN2)
Articles > Articles de recerca
Articles > Articles publicats