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Simultaneous in-plane and out-of-plane exchange bias using a single antiferromagnetic layer resolved by x-ray magnetic circular dichroism
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Simultaneous in-plane and out-of-plane exchange bias using a single antiferromagnetic layer resolved by x-ray magnetic circular dichroism
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Nogués, Josep
(Institut Català de Nanociència i Nanotecnologia)
;
Stepanow, S.
(Centre d'Investigació en Nanociència i Nanotecnologia) ;
Sort Viñas, Jordi
(Centro de Investigaciones Energéticas, Medioambientales y Tecnológicas (Espanya)) ;
Dieny, B.
(Universitat Autònoma de Barcelona. Departament de Física) ;
Nolting, F.
(Paul Scherrer Institut (Suïssa)) ;
Gambardella, Pietro
(Centre d'Investigació en Nanociència i Nanotecnologia) ;
Institució Catalana de Recerca i Estudis Avançats
;
American Physical Society
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