Post-radiation-induced soft breakdown conduction properties as a function of temperature
Cester, Andrea (Universitá di Padova. Dipartimento di Elettronica e Informatica)
Suñé, Jordi, 1963- (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
Paccagnella, Alessandro (Universitá di Padova. Dipartimento di Elettronica e Informatica)
Miranda, Enrique (Universidad de Buenos Aires. Departamento de Física)
American Physical Society

Date:	2001
Abstract:	When a thin oxide is subjected to heavy ion irradiation, a large leakage current similar to the soft breakdown can be produced. In this work, we have studied the radiation soft breakdown (RSB) after 257 MeV Ag and I irradiation by using a quantum point contact (QPC) model, which also applies to hard and soft breakdown produced by electrical stresses. We have also studied the temperature dependence of RSB current from 98 K up to room temperature, and found that the gate current after irradiation is strongly reduced by decreasing temperature. It is shown that this behavior can be attributed to a temperature dependence of the carriers supplied from the cathode rather than to a temperature-induced modification of the size and/or shape of the oxide RSB paths.
Rights:	Tots els drets reservats.
Language:	Anglès
Document:	Article ; recerca ; Versió publicada
Subject:	Electric currents ; Electrical breakdown ; Cathodes ; Electrical properties ; Ion radiation effects ; Ionic conduction ; Leakage currents ; Point contacts
Published in:	Applied physics letters, Vol. 79, Issue 9 (July 2001) , p. 1336-1338, ISSN 1077-3118

DOI: 10.1063/1.1398329

4 p, 300.2 KB

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