Post-radiation-induced soft breakdown conduction properties as a function of temperature
Cester, Andrea (Universitá di Padova. Dipartimento di Elettronica e Informatica)
Suñé, Jordi, 1963-
(Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
Paccagnella, Alessandro (Universitá di Padova. Dipartimento di Elettronica e Informatica)
Miranda, Enrique (Universidad de Buenos Aires. Departamento de Física)
American Physical Society
Data: |
2001 |
Resum: |
When a thin oxide is subjected to heavy ion irradiation, a large leakage current similar to the soft breakdown can be produced. In this work, we have studied the radiation soft breakdown (RSB) after 257 MeV Ag and I irradiation by using a quantum point contact (QPC) model, which also applies to hard and soft breakdown produced by electrical stresses. We have also studied the temperature dependence of RSB current from 98 K up to room temperature, and found that the gate current after irradiation is strongly reduced by decreasing temperature. It is shown that this behavior can be attributed to a temperature dependence of the carriers supplied from the cathode rather than to a temperature-induced modification of the size and/or shape of the oxide RSB paths. |
Drets: |
Tots els drets reservats. |
Llengua: |
Anglès |
Document: |
Article ; recerca ; Versió publicada |
Matèria: |
Electric currents ;
Electrical breakdown ;
Cathodes ;
Electrical properties ;
Ion radiation effects ;
Ionic conduction ;
Leakage currents ;
Point contacts |
Publicat a: |
Applied physics letters, Vol. 79, Issue 9 (July 2001) , p. 1336-1338, ISSN 1077-3118 |
DOI: 10.1063/1.1398329
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