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Effects of high-field electrical stress on the conduction properties of ultra-thin La2O3 films
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Effects of high-field electrical stress on the conduction properties of ultra-thin La2O3 films
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Miranda, Enrique
(Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
;
Molina, J.
(Tokyo Institute of Technology. Frontier Collaborative Research Center) ;
Kim, Y.
(Tokyo Institute of Technology. Frontier Collaborative Research Center) ;
Iwai, H.
(Tokyo Institute of Technology. Frontier Collaborative Research Center) ;
American Physical Society
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