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A flexible characterization methodology of RRAM : application to the modeling of the conductivity changes as synaptic weight updates - Pedro, Marta (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Martin Martinez, Javier (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Rodríguez Martínez, Rosana (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Bargallo Gonzalez, Mireia (Institut de Microelectrònica de Barcelona) ; Campabadal, Francesca (Institut de Microelectrònica de Barcelona) ; Nafría i Maqueda, Montserrat (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
 
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