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Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions
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Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions
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Diaz-Fortuny, Javier
(Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
;
Saraza-Canflanca, Pablo
(Instituto de Microelectrónica de Sevilla) ;
Rodríguez Martínez, Rosana
(Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Martin Martinez, Javier
(Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Castro-Lopez, Rafael
(Instituto de Microelectrónica de Sevilla) ;
Roca, Elisenda
(Instituto de Microelectrónica de Sevilla) ;
Fernandez, Francisco V.
(Instituto de Microelectrónica de Sevilla) ;
Nafría i Maqueda, Montserrat
(Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
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