Application of Synchrotron Radiation-Based Fourier-Transform Infrared Microspectroscopy for Thermal Imaging of Polymer Thin Films
Chávez Ángel, Emigdio (Institut Català de Nanociència i Nanotecnologia)
Ng, Ryan C. (Institut Català de Nanociència i Nanotecnologia)
Sandell, Susanne (Norwegian University of Science and Technology. Department of Structural Engineering)
He, Jianying (Norwegian University of Science and Technology. Department of Structural Engineering)
Castro-Alvarez, Alejandro (Universidad de La Frontera. Centro de Excelencia en Medicina Traslacional (Chile))
Sotomayor Torres, Clivia M. (Institut Català de Nanociència i Nanotecnologia)
Kreuzer, Martin (ALBA Laboratori de Llum de Sincrotró)

Fecha:	2023
Resumen:	The thermal imaging of surfaces with microscale spatial resolution over micro-sized areas remains a challenging and time-consuming task. Surface thermal imaging is a very important characterization tool in mechanical engineering, microelectronics, chemical process engineering, optics, microfluidics, and biochemistry processing, among others. Within the realm of electronic circuits, this technique has significant potential for investigating hot spots, power densities, and monitoring heat distributions in complementary metal-oxide-semiconductor (CMOS) platforms. We present a new technique for remote non-invasive, contactless thermal field mapping using synchrotron radiation-based Fourier-transform infrared microspectroscopy. We demonstrate a spatial resolution better than 10 um over areas on the order of 12,000 um measured in a polymeric thin film on top of CaF substrates. Thermal images were obtained from infrared spectra of poly(methyl methacrylate) thin films heated with a wire. The temperature dependence of the collected infrared spectra was analyzed via linear regression and machine learning algorithms, namely random forest and k-nearest neighbor algorithms. This approach speeds up signal analysis and allows for the generation of hyperspectral temperature maps. The results here highlight the potential of infrared absorbance to serve as a remote method for the quantitative determination of heat distribution, thermal properties, and the existence of hot spots, with implications in CMOS technologies and other electronic devices.
Ayudas:	European Commission 885689 Ministerio de Economía y Competitividad SEV-2017-0706 European Commission 897148
Derechos:	Aquest document està subjecte a una llicència d'ús Creative Commons. Es permet la reproducció total o parcial, la distribució, la comunicació pública de l'obra i la creació d'obres derivades, fins i tot amb finalitats comercials, sempre i quan es reconegui l'autoria de l'obra original.
Lengua:	Anglès
Documento:	Article ; recerca ; Versió publicada
Publicado en:	Polymers, Vol. 15, Issue 3 (February 2023) , art. 536, ISSN 2073-4360

DOI: 10.3390/polym15030536
PMID: 36771835

13 p, 2.5 MB

El registro aparece en las colecciones:
Documentos de investigación > Documentos de los grupos de investigación de la UAB > Centros y grupos de investigación (producción científica) > Ciencias > Institut Català de Nanociència i Nanotecnologia (ICN2)
Documentos de investigación > Documentos de los grupos de investigación de la UAB > Centros y grupos de investigación (producción científica) > Ciencias > El Sincrotrón ALBA
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