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Double-crystal spectrometer measurements of lattice parameters and X-ray topography on heterojunctions GaAs-AlxGa1−xAs
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Double-crystal spectrometer measurements of lattice parameters and X-ray topography on heterojunctions GaAs-AlxGa1−xAs
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Estop, E.
(Centre national de la recherche scientifique (França). Laboratoire de Minéralogie Cristallographie)
;
Izrael, A.
(Centre national de la recherche scientifique (França). Laboratoire de Minéralogie Cristallographie) ;
Sauvage, M.
(Centre national de la recherche scientifique (França). Laboratoire de Minéralogie Cristallographie)
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