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Página principal > Libros y colecciones > Capítulos de libros > Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices |
Fecha: | 2023 |
Resumen: | Time-dependent variability phenomena are stochastic and discrete for nanometer-scale technologies, and, hence, must be statistically characterized. These phenomena are attributed to the emission and capture of charges in device defects. This paper explores two different strategies to extract, from experimental data, the distribution parameters of the time constants of the defects. It delves into the accuracy of each strategy, showing how the extraction strategy can have a huge impact on the accuracy and the amount of characterization data required, and, therefore, on the amount of (expensive) characterization time in the lab. |
Ayudas: | Agencia Estatal de Investigación PID2019-103869RB-C31 Agencia Estatal de Investigación PID2019-103869RB-C32 Agencia Estatal de Investigación TED2021-131240B-I00 |
Nota: | Altres ajuts: ProyExcel_00536 funded by Consejería de Universidad, Investigación e Innovación of Junta de Andalucía |
Derechos: | Tots els drets reservats. |
Lengua: | Anglès |
Documento: | Capítol de llibre ; recerca ; Versió acceptada per publicar |
Materia: | Characterization ; Modeling ; Parameter extraction ; Time-dependent variability |
Publicado en: | 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2023, ISBN 979-8-3503-3265-0 |
Disponible a partir de: 2025-07-31 Postprint |