Towards a Reliable PUF Using Organic Thin-Film Transistors
De Los Santos-Prieto, F. (Instituto de Microelectrónica de Sevilla)
Eric, Deborah (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
Porti i Pujal, Marc (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
Castro-Lopez, Rafael (Instituto de Microelectrónica de Sevilla)
Roca, E. (Instituto de Microelectrónica de Sevilla)
Fernandez, F. V. (Instituto de Microelectrónica de Sevilla)
Nafría i Maqueda, Montserrat (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)

Publicación:	Institute of Electrical and Electronics Engineers, 2025
Descripción:	4 pàg.
Resumen:	As printed electronics continue to evolve, Organic Thin Film Transistors (OTFTs) still present high process-induced variability. Paradoxically, this feature can be used for security purposes. Specifically, Physical Unclonable Functions (PUFs) that provide cryptographic keys for low-cost, resource-constrained applications take advantage of this. However, the reliability of OTFT-based PUFs remains a significant challenge, as thermal annealing, bias stress, and the passage of time (even after being powered off) can introduce instabilities, thus altering the cryptographic keys they generate. To address this issue, we have successfully implemented an optimization-based bit selection approach to enhance their reliability. Our evaluation considers reliability holistically, accounting for thermal annealing, bias stress, and off time degradations. The results demonstrate that by strategically optimizing challenge-response pair selection, the integrity of the generated keys is not compromised. In this work, the feasibility of OTFT-based PUFs and the solutions to key limitations are presented as a step towards improving the practicality and robustness of security solutions for printed electronics.
Ayudas:	Agencia Estatal de Investigación PID2022-136949OB-C21 Agencia Estatal de Investigación PID2022-136949OB-C22
Nota:	Altres ajuts: grant ProyExcel 00536 funded by Consejería de Universidad, Investigación e Innovación de la Junta de Andalucía; grant USECHIP (TSI-069100-2023-001)
Derechos:	Aquest material està protegit per drets d'autor i/o drets afins. Podeu utilitzar aquest material en funció del que permet la legislació de drets d'autor i drets afins d'aplicació al vostre cas. Per a d'altres usos heu d'obtenir permís del(s) titular(s) de drets.
Lengua:	Anglès
Documento:	Capítol de llibre ; recerca ; Versió acceptada per publicar
Materia:	Bit Selection ; Optimization ; OTFT ; PUF ; Reliability
Publicado en:	21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD), 2025 , ISBN 979-8-3315-2395-4

DOI: 10.1109/SMACD65553.2025.11091991

4 p, 2.2 MB

Disponible a partir de: 2027-07-31 Postprint

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