A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation
Saraza-Canflanca, P. (Instituto de Microelectrónica de Sevilla)
Martin Martinez, Javier (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
Roca, E. (Instituto de Microelectrónica de Sevilla)
Castro-Lopez, R. (Instituto de Microelectrónica de Sevilla)
Rodríguez Martínez, Rosana (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
Nafría i Maqueda, Montserrat (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
Fernandez, F. V. (Instituto de Microelectrónica de Sevilla)

Date:	2022
Abstract:	This paper addresses the automated parameter extraction of Random Telegraph Noise (RTN) models in nanoscale field-effect transistors. Unlike conventional approaches based on complex extraction of current levels and timing of trapping/de-Trapping events from individual defects in current traces, the proposed approach performs a simple processing of current traces. A smart optimization problem formulation allows getting distribution functions of the amplitude of the current shifts and of the number of active defects vs. Time.
Grants:	Agencia Estatal de Investigación PID2019-103869RB-C31 Agencia Estatal de Investigación PID2019-103869RB-C32
Note:	Altres ajuts: grant US-1380876 funded by Consejería de Economía, Conocimiento, Empresas y Universidad de la Junta de Andalucía
Rights:	Tots els drets reservats.
Language:	Anglès
Document:	Capítol de llibre ; recerca ; Versió acceptada per publicar
Subject:	Modeling characterization ; RTN ; Time-dependent variability
Published in:	18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2022, ISBN 978-1-6654-6703-2

DOI: 10.1109/SMACD55068.2022.9816234

Available from: 2024-06-30 Postprint

The record appears in these collections:
Research literature > UAB research groups literature > Research Centres and Groups (research output) > Engineering > The Reliability of Electron Devices and Circuits group (REDEC)
Books and collections > Book chapters