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A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation - Saraza-Canflanca, P. (Instituto de Microelectrónica de Sevilla) ; Martin Martinez, Javier (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Roca, E. (Instituto de Microelectrónica de Sevilla) ; Castro-Lopez, R. (Instituto de Microelectrónica de Sevilla) ; Rodríguez Martínez, Rosana (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Nafría i Maqueda, Montserrat (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Fernandez, F. V. (Instituto de Microelectrónica de Sevilla)
 
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