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Recovery of the MOSFET and circuit functionality after the dielectric breakdown of ultra-thin high-k gate stacks
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Recovery of the MOSFET and circuit functionality after the dielectric breakdown of ultra-thin high-k gate stacks
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Crespo Yepes, Albert
(Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
;
Martin Martinez, Javier
(Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Rothschild, A.
(Interuniversity Micro-Electronics Center) ;
Rodríguez Martínez, Rosana
(Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Nafría i Maqueda, Montserrat
(Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Aymerich Humet, Xavier
(Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
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