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Modeling and simulation of successive breakdown events in thin gate dielectrics using standard reliability growth models
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Modeling and simulation of successive breakdown events in thin gate dielectrics using standard reliability growth models
-
Miranda, Enrique
(Universitat Autònoma de Barcelona)
;
Aguirre, Fernando Leonel
(Universitat Autònoma de Barcelona) ;
Salvador, E.
(Universitat Autònoma de Barcelona) ;
Bargallo Gonzalez, Mireia
(Institut de Microelectrònica de Barcelona) ;
Campabadal, Francesca
(Institut de Microelectrònica de Barcelona) ;
Suñé, Jordi
1963- (Universitat Autònoma de Barcelona)
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