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Scopus: 36 cites, Web of Science: 37 cites,
Measuring electrical current during scanning probe oxidation
Pérez Murano, Francesc (Institut de Microelectrònica de Barcelona (IMB-CNM))
Martín Olmos, Cristina (Institut de Microelectrònica de Barcelona (IMB-CNM))
Barniol i Beumala, Núria (Universitat Autònoma de Barcelona. Departament de Enginyeria Electrònica)
Kuramochi, H. (Nanotechnology Research Institute (Ibaraki, Japó))
Yokoyama, H. (Nanotechnology Research Institute (Ibaraki, Japó))
Dagata, J. A. (National Institute of Standards and Technology (Gaithersburg, Estats Units d'Amèrica))
American Physical Society

Data: 2003
Resum: Electrical current is measured during scanning probe oxidation by performing force versus distance curves under the application of a positive sample voltage. It is shown how the time dependence of the current provides information about the kinetics of oxide growth under conditions in which the tip–surface distance is known unequivocally during current acquisition. Currentmeasurements at finite tip–sample distance, in particular, unveil how the geometry of the meniscus influences its electrical conduction properties as well as the role of space charge at very small tip–sample distances.
Drets: Tots els drets reservats.
Llengua: Anglès
Document: article ; recerca ; publishedVersion
Matèria: Electric currents ; Electric measurements ; Oxidation ; Charged currents ; Electrical properties
Publicat a: Applied Physics Letters, Vol. 82, Issue 18 (April 2003) , p. 3086-3088, ISSN 1077-3118

DOI: 10.1063/1.1572480

4 p, 227.5 KB

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